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13104709993
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真(zhen)理(li)(li)光(guang)(guang)(guang)學(xue)(xue)儀(yi)器(qi)(qi)有限公(gong)司專(zhuan)注于Gao端(duan)顆粒(li)(li)表征(zheng)儀(yi)器(qi)(qi)的研發和制(zhi)造(zao)，產品(pin)涵蓋(gai)激光(guang)(guang)(guang)（衍(yan)射法）粒(li)(li)度分(fen)析儀(yi)、動(dong)態光(guang)(guang)(guang)散射納米粒(li)(li)度及(ji)Zeta電位分(fen)析儀(yi)以及(ji)顆粒(li)(li)圖像分(fen)析儀(yi)，既(ji)有實驗(yan)室儀(yi)器(qi)(qi)，又有在線(xian)檢測系統。真(zhen)理(li)(li)光(guang)(guang)(guang)學(xue)(xue)秉持(chi)“科學(xue)(xue)態度，工匠精神”，為用戶提供世界(jie)Xian進的Gao端(duan)產品(pin)和服務。
真理(li)光(guang)學(xue)匯(hui)集了以張(zhang)福根(gen)博(bo)士為代(dai)表的(de)(de)全國(guo)(guo)(guo)顆(ke)(ke)粒(li)(li)表征(zheng)領域(yu)的(de)(de)頂尖人(ren)才(cai)。張(zhang)福根(gen)博(bo)士現任(ren)本公(gong)(gong)(gong)司董事長兼首Xi科(ke)學(xue)家，還(huan)擔任(ren)全國(guo)(guo)(guo)顆(ke)(ke)粒(li)(li)表征(zheng)及分檢與篩網標準化(hua)技術委(wei)(wei)員會副主任(ren)委(wei)(wei)員、天津大學(xue)兼職教授，曾(ceng)擔任(ren)中(zhong)國(guo)(guo)(guo)顆(ke)(ke)粒(li)(li)學(xue)會副理(li)事長，同時也是“歐美克(ke)”字號公(gong)(gong)(gong)司的(de)(de)創(chuang)始人(ren)。曾(ceng)擔任(ren)英國(guo)(guo)(guo)某粒(li)(li)度儀器公(gong)(gong)(gong)司中(zhong)國(guo)(guo)(guo)總經理(li)20余年的(de)(de)秦和義先(xian)生擔任(ren)本公(gong)(gong)(gong)司商務總經理(li)，中(zhong)國(guo)(guo)(guo)顆(ke)(ke)粒(li)(li)學(xue)會青年理(li)事潘林超博(bo)士、陳進博(bo)士擔綱公(gong)(gong)(gong)司的(de)(de)研發(fa)主力。
激光(guang)（衍(yan)射(she)法）粒(li)(li)(li)度(du)儀(yi)雖然已(yi)得到廣泛(fan)應用，但(dan)它并(bing)不Wan美(mei)，不論是科學基礎方(fang)(fang)面，還是技(ji)(ji)術(shu)方(fang)(fang)案方(fang)(fang)面。真理(li)光(guang)學的(de)(de)(de)團(tuan)隊針對(dui)當前市面上儀(yi)器存在的(de)(de)(de)不足，展開了系統的(de)(de)(de)理(li)論研究(jiu)和技(ji)(ji)術(shu)創新，發(fa)現了衍(yan)射(she)光(guang)斑（愛里(li)斑）的(de)(de)(de)反(fan)常(chang)變化現象（ACAD），解釋了為什(shen)么不能測(ce)(ce)量3μm左右的(de)(de)(de)聚苯乙(yi)烯微(wei)球(qiu)，并(bing)給(gei)出(chu)了反(fan)常(chang)區（不能測(ce)(ce)量粒(li)(li)(li)徑）的(de)(de)(de)一(yi)般公(gong)式；研究(jiu)了衍(yan)射(she)儀(yi)器的(de)(de)(de)測(ce)(ce)量上限和下(xia)限；研究(jiu)了顆粒(li)(li)(li)折(zhe)射(she)率(lv)偏差對(dui)測(ce)(ce)量結(jie)果的(de)(de)(de)影響，發(fa)明了兩種根(gen)據散射(she)光(guang)分(fen)布估算顆粒(li)(li)(li)折(zhe)射(she)率(lv)的(de)(de)(de)方(fang)(fang)法;提(ti)出(chu)了斜置(zhi)梯形窗口技(ji)(ji)術(shu)方(fang)(fang)案（Zhuan利），解決(jue)了前向(xiang)超大角測(ce)(ce)量盲區的(de)(de)(de)問題，使衍(yan)射(she)儀(yi)器的(de)(de)(de)亞微(wei)米顆粒(li)(li)(li)測(ce)(ce)量水平顯著提(ti)高(gao)(gao);提(ti)出(chu)了統一(yi)的(de)(de)(de)反(fan)演算法（專有技(ji)(ji)術(shu)），消除了不同計算模式給(gei)出(chu)不同結(jie)果的(de)(de)(de)尷尬；設計出(chu)了高(gao)(gao)達20Kfps的(de)(de)(de)超高(gao)(gao)速并(bing)行數據采樣(yang)電(dian)路，使干(gan)法測(ce)(ce)量的(de)(de)(de)精度(du)不亞于濕法測(ce)(ce)量，對(dui)高(gao)(gao)速噴霧場的(de)(de)(de)測(ce)(ce)量（時間）分(fen)辨率(lv)也更高(gao)(gao)。
在納米(mi)粒度及Zeta電位(wei)儀(yi)方面，真理光(guang)(guang)學(xue)提出了(le)比相位(wei)分(fen)析法(fa)（PALS）更先進的(de)余弦擬(ni)合相位(wei)分(fen)析法(fa)（CF-PALS），用光(guang)(guang)纖分(fen)束取代了(le)傳統(tong)的(de)平板(ban)分(fen)束鏡分(fen)束，用光(guang)(guang)纖內光(guang)(guang)干涉取代了(le)自由空間干涉，使Zeta電位(wei)的(de)測量重復性大幅度提高。
Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.
Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.
Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.
In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.
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